Epson C I - 4 5 Bedienungsanleitung Seite 3

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1960 E. Grand Ave., 2
nd
Floor,
El Segundo, California 90245
Phone: 310.955.5300
Fax: 310.955.5400
CONTENTS
CONTENTS
1. Purpose and Scope 1
2. Methods for improving design 1
2.1. Confirmation of the oscillation circuit and construction of the IC 1
2.2. Determine the preliminary values 2
2.3. Useful board design for the evaluation 2
2.4. Characteristics of each parameter of the oscillation circuit 3
3. Circuit evaluation 3
3.1. Deciding the best parameters 3
3.2. Deciding the CL value 4
4. Measurement procedure 4
4.1. Measurement of the Drive Level 4
4.1.1. Measurement of the Drive Level for AT crystals 4
4.1.2. Measurement of the Drive Level for Tuning Fork crystals 5
4.1.3. How to use a current probe 5
4.2. Measurement of the Oscillation Allowance 6
4.3. Actual data sampling 6
5. Other circuits and frequencies 6
5.1. Series resonance circuit for C-MOS inverter 7
5.2. Overtone oscillation circuit for AT crystals 7
Appendix A. Oscillation Circuit Example 8
i. Through hole parts 8
ii. Surface mount parts 9
Appendix B. Example of the Drive Level, Oscillation Allowance Characteristics 10
Appendix C. Measurement of Negative Resistance using the S - Parameter 11
Appendix D. Example of the Evaluation Equipment 13
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